PL Mapping Device YWafer Mapper RD8
Customizable Wavelength Range: 200nm - 5nu Compatible Wafer Mapping Device Wafer PL Photoluminescence Multifunctional
The RD8 series wafer mapping device is designed to accommodate various wafer sizes and shapes with a maximum measurement area of 200×200 mm. Basic measurements include photoluminescence, epitaxial film thickness, wafer warpage, transmittance and reflectance, back-side illuminated phosphor analysis, and wafer thickness measurement. We also offer customized solutions to meet our customers' specific needs.
- Company：ワイ・システムズ
- Price：10 million yen-50 million yen
